D8 Venture X-ray Diffractometer

Bruker

  • Microfocus, TXS Rotating Anode (Cu-Radiation)
  • Standard data collection as well as highly redundant data collections for heavy-atom or sulphur-SAD phasing
  • In-situ crystal diffraction can also be performed
  • Supported Crystallization Plate Types:
    • ARI 96-2 Shallow well (102-0001-20)
    • ARI 96-3 LVR (102-0001-03)

 

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